Morphology and interdiffusion behavior of evaporated metal films on crystalline diindenoperylene thin films

We present a transmission electron microscopy ~TEM!/Rutherford backscattering spectrometry ~RBS!/x-ray-diffraction ~XRD! study of Au evaporated on crystalline organic thin films of diindenoperylene ~DIP!. Cross-sectional TEM shows that the preparation conditions of the Au film ~evaporation rate and substrate temperature! strongly determine the interfacial morphology. In situ XRD during annealing reveals that the organic layer is thermally stable up to about 150 °C, a temperature sufficient for most electronic applications. The x-ray measurements show that the ‘‘as-grown’’ Au layer exhibits a large mosaicity of around 10°. Upon annealing above '120 °C the Au film starts to reorder and shows sharp ~111!-diffraction features. In addition, temperaturedependent RBS measurements indicate that the Au/DIP interface is thermally essentially stable against diffusion of Au in the DIP layer up to '100 °C on the time scale of hours, dependent on the Au thickness. © 2003 American Institute of Physics. @DOI: 10.1063/1.1556180#